Portable Four-Point Probe & Conductivity Type Tester

1. Introduction

This instrument adopts the mature thermoelectric method principle to detect the conductivity type of semiconductors.

Compared with traditional thermoelectric type testers, it has the following advantages and can effectively replace old-generation models:

Compact size and easy to carry.

It maintains the temperature difference between probes with ultra-low power consumption. Powered by a 9V battery, it is suitable for various application scenarios, supporting continuous operation for 8–10 hours.

The cold and hot probes are integrated into one probe head with a spacing of about 10 mm. Single-hand operation is available for great convenience.

2. Testing Range

Applicable for conductivity type determination of silicon materials with resistivity from 0.001 to 1000 Ω·cm, as well as other semiconductor materials with similar thermoelectric effects.

3. Probe Selection

The standard configuration is spring-loaded tungsten probes.For applications requiring no surface indentation, non-marking probes are optional. Please consult our technical team for details.

4. Operating Instructions

a. Install a 9V battery, connect the probe cable and probe head, then turn on the power switch. The power indicator will light up. Preheat the probe head for no less than 10–20 seconds.

b. Place the probe head lightly on the silicon wafer surface. Do not press hard. It is recommended to gently touch the wafer until the conductivity type is displayed. Avoid full pressing to extend probe service life and reduce maintenance costs.

c. Turn off the power switch when not in use to save battery power.