Compact Four-Point Probe Tester for Resistivity of Silicon Wafers, ITO Films & More

Product Features：

The Portable Silicon Material Tester SSRPT is a high-precision and portable resistivity testing instrument specifically designed for field inspection and laboratory measurement.Adopting the four-point probe method principle, it can quickly and accurately measure the resistivity of silicon materials such as silicon wafers and silicon rods. It features simple operation and precise test data.

Technical Specifications：

Measurement Range: 0.001 ~ 1000 Ω·cm

Measurement Accuracy: ±5% (with standard samples)

Sample Size: Diameter ≥ 10 mm

Power Supply: 9V battery, battery life ≥ 8 hours

Dimensions: 130 × 25 × 65 mm

Weight: Approx. 0.3 kg

Product Features：

High-precision measurement with excellent repeatability

Portable design with rechargeable battery, ideal for on-site testing

Supports both resistivity and conductivity type testing

Large screen display for clear data readout

Direct resistivity readout with preset sample thickness