Portable Four Point Probe Resistivity Tester for Silicon Wafers | High-Precision Sheet Resistance Meter

Portable Four Point Probe Resistivity Tester for Silicon Wafers | High-Precision Sheet Resistance Meter

Model: M3

This portable four-point probe tester provides high-precision measurement of silicon wafer resistivity and thin-film sheet resistance.

Compact and easy to use, it enables fast, non-destructive testing for semiconductor labs, research, and quality control.

Product Features：

Item	Specification
Measurement Range	Resistivity: 0.010 Ω·cm ~ 20.00 kΩ·cm Sheet Resistance: 0.050 Ω/□ ~ 100.00 kΩ/□ Resistance: 0.010 Ω ~ 50.00 kΩ
Test Current Range	1.0 μA, 10 μA, 100 μA, 1.0 mA, 1.0 mA
Voltmeter	20 mV
Main Unit Power	1 × DC 4.2 VDC Lithium Battery
Power Adapter	220V ± 10%
Power Consumption	< 1 W
Dimensions	210 mm (L) × 105 mm (W) × 35 mm (H)
Weight	≤ 250 g
Operating Temperature	0℃ – 40℃
Operating Humidity	≤ 60%

The instrument is suitable for testing the electrical conductivity of materials in the semiconductor industry. Some of the testable materials are shown below: