Precision Probe Card Assembly Micrometer Probe Station for Wafer Testing with XYZ 3D Stage

Precision Probe Card Assembly Micrometer Probe Station for Wafer Testing with XYZ 3D Stage

Adjustable Axes: X-axis + Y-axis + Z-axis
Adjustment Stroke: X 12mm / Y 12mm / Z 12mm
Adjustment Method: Precision Micrometer Head
Guide Rail Structure: Ball Roller Guide Rail
Screw Precision: 0.25mm per revolution
Adjustment Precision: 1μm
Working Surface Size: 40mm * 40mm
Overall Dimensions: L 112mm * W 88mm * H 108mm
Fixing Method: Strong Magnetic Table Base / Vacuum Base
Net Weight: 0.96kg

Product Info

The precision micro-differential head needle seat adopts a precision micro-differential head drive with 0.25mm per revolution. The three axes use ball roller guides and are assembled and debugged according to specific processes. The LA-4040V needle seat features no backlash and high precision in controllable micro-distance, ensuring that customers obtain a stable control experience during use.

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Product Parameters
Adjustable Axes	X-axis + Y-axis + Z-axis
Adjustment Stroke	X 12mm / Y 12mm / Z 12mm
Adjustment Method	Precision Micrometer Head
Guide Rail Structure	Ball Roller Guide Rail
Screw Precision	0.25mm per revolution
Adjustment Precision	1μm
Working Surface Size	40mm * 40mm
Mounting position	Horizontal direction	25mm
Mounting position	Vertical direction	8mm - 10mm -8mm
Overall Dimensions	L 112mm * W 88mm * H 108mm
Fixing Method	Strong Magnetic Table Base / Vacuum Base
Net Weight	0.96kg
The gripper can be customized.